SN74AUP3G17DCUR 供应商
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SN74AUP3G17DCUR
品牌:TI 封装/批号:原厂原装/22+ -
SN74AUP3G17DCUR
品牌:TI(德州仪器) 封装/批号:VSSOP-8/2022+ -
SN74AUP3G17DCUR
品牌:TI 封装/批号:/2021+
SN74AUP3G17DCUR 属性参数
- 标准包装:1
- 类别:集成电路 (IC)
- 家庭:逻辑 - 缓冲器,驱动器,接收器,收发器
- 系列:74AUP
- 逻辑类型:施密特触发器 - 缓冲器,驱动器
- 元件数:3
- 每个元件的位元数:1
- 输出电流高,低:4mA,4mA
- 电源电压:0.8 V ~ 3.6 V
- 工作温度:-40°C ~ 85°C
- 安装类型:表面贴装
- 封装/外壳:8-VFSOP(0.091",2.30mm 宽)
- 供应商设备封装:US8
- 包装:®
- 其它名称:296-25596-6
产品特性
- Available in the Texas Instruments NanoStar™ Package
- Low Static-Power Consumption (ICC = 0.9 µA Maximum)
- Low Dynamic-Power Consumption (Cpd = 4.3 pF Typ at 3.3 V)
- Low Input Capacitance (Ci = 1.5 pF Typical)
- Low Noise Overshoot and Undershoot <10% of VCC
- Ioff Supports Partial-Power-Down Mode Operation
- Wide Operating VCC Range of 0.8 V to 3.6 V
- Optimized for 3.3-V Operation
- 3.6-V I/O Tolerant to Support Mixed-Mode Signal Operation
- tpd = 5.1 ns Maximum at 3.3 V
- Suitable for Point-to-Point Applications
- Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
- ESD Performance Tested Per JESD 22 2000-V Human-Body Model (A114-B, Class II) 1000-V Charged-Device Model (C101)
- 2000-V Human-Body Model (A114-B, Class II)
- 1000-V Charged-Device Model (C101)
产品概述
The AUP family is TIs premier solution to the industrys low-power needs in battery-powered portable applications. This family ensures a very low static- and dynamic-power consumption across the entire VCC range of 0.8 V to 3.6 V, resulting in increased
battery life. This product also maintains excellent signal integrity.The SN74LVC3G17 contains three buffers and performs the Boolean function Y = A. The device functions as three independent buffers but, because of Schmitt action, it may have different input
threshold levels for positive-going (VT+) and negative-going (VT) signals.NanoStar™ package technology is a major breakthrough in IC packaging concepts, using the die as the package.This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.